Tungsten probe mainly refers to a probe made of pure tungsten or rhenium tungsten and other tungsten materials with characteristics of high hardness, high elastic modulus, good reliability and mechanical stability. Such a probe is mainly used in wafer inspection, or detection of LED, LCD and other chips. It will not be not easy to damage the chips.
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There are a variety of pointed shapes of tungsten probes, such as extremely sharp points, arcs, and platforms. The needle tip ranges from micron to nanometer. The minimum radius of curvature of the needle tip can be controlled to 50nm. The smoothness of the cone can reach Ra0.25 or less. The entire probe can be plated in whole or in part with nickel, tin, gold, etc. The tip can be subjected to certain treatments, such as bending forming and slotting. The diameter range of the tungsten probe is 0.076-1.2mm, the length range is 15-300mm, and the needle tip range is 0.08-50mm.
